Electromigration in ULSI Interconnections (International Series on Advances in Solid State Electronics & Technology)
by Cher Ming Tan,Arijit Roy
ISBN 13: 9789814273329
Format: Hardcover (312 pages) Publisher: World Scientific Publishing Co Pte Ltd Published: 01 Oct 2010
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)
by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
ISBN 13: 9780857293091
Format: Hardcover (157 pages) Publisher: Springer Published: 07 Mar 2011
Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology)
by Cher Ming Tan,Feifei He
ISBN 13: 9789814451208
Format: Paperback (116 pages) Publisher: Springer Published: 04 May 2013
by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou
ISBN 13: 9781447126416
Format: Paperback (160 pages) Publisher: Springer Published: 21 Apr 2013
Theory and Practice of Quality and Reliability Engineering in Asia Industry
by Cher Ming Tan,Thong Ngee Goh
ISBN 13: 9789811098345
Format: Paperback (316 pages) Publisher: Springer Published: 14 Jul 2018
Graphene and VLSI Interconnects
by Cher-Ming Tan, Udit Narula, Vivek Sangwan
ISBN 13: 9789814877824
Format: Hardcover (116 pages) Publisher: Jenny Stanford Publishing Published: 31 Oct 2021
Simulated Annealing
by Cher Ming Tan
ISBN 13: 9789537619077
Format: Hardcover (430 pages) Publisher: IntechOpen Published: 01 Sep 2008