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Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology)

by Cher Ming Tan,Feifei He

ISBN 13: 9789814451208

Format: Paperback (116 pages)
Publisher: Springer
Published: 04 May 2013

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)

by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou

ISBN 13: 9781447126416

Format: Paperback (160 pages)
Publisher: Springer
Published: 21 Apr 2013

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Theory and Practice of Quality and Reliability Engineering in Asia Industry

by Cher Ming Tan,Thong Ngee Goh

ISBN 13: 9789811098345

Format: Paperback (316 pages)
Publisher: Springer
Published: 14 Jul 2018

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Graphene and VLSI Interconnects

by Cher-Ming Tan, Udit Narula, Vivek Sangwan

ISBN 13: 9789814877824

Format: Hardcover (116 pages)
Publisher: Jenny Stanford Publishing
Published: 31 Oct 2021

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